Paper

IEEE Conference on Computer Vision and Pattern Recognition (CVPR), p

Martin Hirzer, Large scale metric learning from equivalence constraints, Proceedings of the 2012 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), p.2288-2295, June 16-21, 2012

2012

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Last updated by ACM worker at 2019-04-11 14:23:26.0.
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