Paper

Mutation Testing Applied to Validate SDL Specifications

SUGETA, T. ; MALDONADO, J. C. ; WONG, W. E. . Mutation Testing Applied to Validate SDL Specifications. In: 16th IFIP International Conference on Testing of Communicating Systems, 2004, Oxford. Proceedings of the 16th IFIP International Conference on Testing of Communicating Systems, 2004. v. 2978. p. 193-208.

2004

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