Paper

Delay and slew metrics using the lognormal distribution

2003

Created by Alysson Bolognesi Prado at 2019-03-28 11:02:34.0.

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Bibliographic Sets

1

ACM - affordances

Research Paradigm

Authors

4

Charles J. Alpert

Chandramouli Kashyap

Venue

1

Proceedings of the 40th conference on Design automation - DAC ’03

References

13

A delay metric for RC circuits based on the Weibull distribution

Timing metrics for physical design of deep submicron technologies

Asymptotic Waveform Evaluation for Timing Analysis

Signal Delay in RC Tree Networks