GPGPUs ECC efficiency and efficacy
Modern GPUs Radiation Sensitivity Evaluation and Mitigation Through Duplication With Comparison
Memory Access Time and Input Size Effects on Parallel Processors Reliability
IEEE Transactions on Nuclear Science
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Philippe Olivier Alexandre Navaux
Paolo Rech
Luigi Carro
Philippe O. A. Navaux
Laercio L. Pilla
Caio Lunardi