Paper

Automatic inspection system of LED chip using two-stages back-propagation neural network

Kuo, C.F.J., Hsu, C.T.M.Z., Liu, X., Wu, H.C.: Automatic inspection system of LED chip using two-stages back-propagation neural network. Journal of Intelligent Manufacturing 25(6), 1235–1243 (2014)

2014

Created by Alysson Bolognesi Prado at 2016-07-24 09:21:53.0.
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