Exponentially more Succinct Test Suites

We present a generalized test case generation method, or G-method, extending some previous work. Although inspired on the W-method, the G-method, in contrast, allows for test case suite generation even in the absence of characterization sets for the specification models. Instead, the G-method relies on knowledge about the index of certain equivalences induced in the implementation models. We show that the W-method can be derived from the G-method as a particular case. Moreover, we discuss some naturally occurring infinite classes of FSM models over which the G-method generates test suites that are exponentially more compact than those produced by the W-method. Proofs for important results are presented in detail.

2009